X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987
von:
David Sayre
·
Malcolm Howells
·
Janos Kirz
Taschenbuch
Details (
United States
)
ISBN: 978-3-662-14489-3
ISBN-10: 3-662-14489-1
Springer
· 2014
Siehe auch:
2013
Taschenbuch
X-Ray Microscopy II: "Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987" (Springer Series in Optical Sciences, Band 56)
1988
Gebundene Ausgabe
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31–September 4, 1987 (Springer Series in Optical Sciences, Band 56)