X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 (Springer Series in Optical Sciences, Band 56)

Proceedings

von: David Sayre · Malcolm Howells · Janos Kirz · Harvey Rarback

Gebunden

ISBN-13: 978-3-540-19392-0

ISBN-10: 3-540-19392-8

Springer · 1988
S. auch:
2014PaperbackX-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987
2013TaschenbuchX-Ray Microscopy II: "Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987" (Springer Series in Optical Sciences, Band 56)