X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996

International

von: Jürgen Thieme · Günter Schmahl · Dietbert Rudolph · Eberhard Umbach

Taschenbuch

ISBN: 978-3-642-72108-3

ISBN-10: 3-642-72108-7

Springer · 2014
S. auch:
2014PaperbackX-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996
1998Gebundene AusgabeX-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996