X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996

International

von: Jürgen Thieme · Günter Schmahl · Dietbert Rudolph · Eberhard Umbach

Gebunden

ISBN: 978-3-540-63998-5

ISBN-10: 3-540-63998-5

Springer · 1998
Siehe auch:
2014PaperbackX-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996
2014TaschenbuchX-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996