Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, Band 270)

Technologies

von Cor Claeys

Taschenbuch

ISBN-13: 978-3-030-06747-2

ISBN-10: 3-030-06747-5

Springer · 5. September 2019

S. auch:
2018Gebundene AusgabeMetal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, Band 270)