Noise Figure Characterization: An introduction to on-wafer noise figure measurement

introduction

von: Shukri Mohd · Othman Sidek · Muhamad Azman Miskam

Taschenbuch

EAN=ISBN-13: 978-3-8443-2873-8

ISBN-10: 3-8443-2873-4

LAP LAMBERT Academic Publishing · 2011