Passive and Active Measurement: 12th International Conference, PAM 2011, Atlanta, GA, USA, March 20-22, 2011, Proceedings (Lecture Notes in Computer Science, Band 6579)
von:
Neil Spring
· George F. Riley
Taschenbuch
Details (
Deutschland
)
ISBN: 978-3-642-19259-3
ISBN-10: 3-642-19259-9
Springer
· 2011