Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics)

Ellipsometry

von Mathias Schubert

Taschenbuch

ISBN: 978-3-642-06228-5

ISBN-10: 3-642-06228-8

Springer · 2010

S. auch:
2004Gebundene AusgabeInfrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics, Band 209)