High speed and Highly Accurate Tip-Scanning Atomic Force Microscope: Design Methodology, Control Strategy, and Performance Evaluation for the ... Microscope for the Industrial Large Samples

Performance

von Dong-Yeon Lee

Taschenbuch

ISBN-13: 978-3-639-00270-6

ISBN-10: 3-639-00270-9

VDM Verlag Dr. Müller · 2013