Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State (Springer Tracts in Modern Physics (182), Band 182)

von Andreas Rosenauer

Gebunden

EAN=ISBN-13: 978-3-540-00414-1

ISBN-10: 3-540-00414-9

S. auch:
2013	Taschenbuch	Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State (Springer Tracts in Modern Physics (182), Band 182)