Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Principles

von R.F. Egerton

Taschenbuch

ISBN-13: 978-3-319-81986-0

ISBN-10: 3-319-81986-0

Springer · 2018
S. auch:
2016Gebundene AusgabePhysical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
2011HardcoverPhysical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
2010PaperbackPhysical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM