Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

Mitigating

von: Gracieli Posser · Sachin S. Sapatnekar · Ricardo Reis

Gebunden

ISBN: 978-3-319-48898-1

ISBN-10: 3-319-48898-8

Springer · 2016

Siehe auch:
2018TaschenbuchElectromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in Nanocmos